Enlitech to Attend the 26th China International Optoelectronic Exposition (CIOE 2025)

Enlitech will attend the 26th China International Optoelectronic Exposition (CIOE 2025) at the Shenzhen World Exhibition & Convention Center from September 10–12, 2025.
As a world-leading event for the optoelectronics and semiconductor industries, CIOE brings together experts and companies from around the world related to optoelectronic components, semiconductor devices, optical inspection, smart sensing, and AIoT applications. 

Enlitech to Showcase the Latest Equipment for Smart Sensing and Semiconductor Optical Inspection

At the Intelligent Sensing Expo (Hall 6) of CIOE 2025, Enlitech will present its cutting-edge semiconductor optical testing solutions, helping researchers and engineers accurately validate the performance of optoelectronic sensors, SPADs, and CMOS image sensors.

Featured exhibits include:

• SPD2200: A commercial-grade integrated tester for SPAD (Single-Photon Avalanche Diode) efficiency
• APD-QE: An advanced optical instrument for the quantum efficiency of photosensors
• SG-A: A tester for CMOS image sensors

This equipment assists researchers and industry engineers in overcoming performance bottlenecks in high-speed chips, smart sensors, and optoelectronic applications.

We Sincerely Invite You to Visit Enlitech at Booths 6E50 & 6E51

Enlitech’s professional team will be on-site to explain the value of optical testing and smart sensing applications. We cordially invite you to visit booths 6E50 and 6E51 to discuss the future trends of semiconductor optical testing with us!