Enlitech at IEEE 33rd INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA 2026)｜Date: July 13–16, 2026｜Venue: Marina Bay Sands, Singapore

．Technical Presentation

Spectral Imaging–Based Optical Loss Mapping for Efficient Failure Analysis and Wafer-Level Screening of Silicon Photonic Integrated Circuits

．Presenter: Dr. Joseph Liao

As silicon photonics moves toward large-scale deployment in Co-Packaged Optics (CPO), identifying optical defects quickly and accurately has become a critical challenge for manufacturing yield and reliability.

At IPFA 2026, Enlitech will present an innovative spectral imaging approach that directly visualizes optical propagation inside silicon photonic integrated circuits (PICs), enabling rapid optical loss mapping and efficient defect localization.

Join Dr. Joseph Liao at IPFA 2026 to discover how spectral imaging is transforming silicon photonics failure analysis.