Boosting Silicon Photonics Yield in the AI & CPO Era
As demand for high-bandwidth data centers and AI servers continues to surge, the transition from copper interconnects to optical interconnects, together with Co-Packaged Optics (CPO), has become inevitable.
However, with the rising costs of heterogeneous integration and advanced packaging, the ability to accurately identify Known Good Dies (KGDs) before packaging has become the key determinant of manufacturing yield and profitability.
Enlitech’s wafer-level silicon photonics testing solutions address these industry challenges with two powerful platforms:
NightJar™ Defect Inspection System
．Making Defects Impossible to Hide with Hyperspectral Imaging
．Precisely locates and characterizes defects using hyperspectral imaging (location, classification, and quantification)
．Comprehensive O-to-O characterization, including Insertion Loss (IL), State of Polarization (SOP), and optoelectronic response
．Wafer-level Defect Mapping with up to 60× faster inspection speed
．Supports KGD screening throughout the entire WAT/CP/FT manufacturing lifecycle
FireFox-1310 Reliability Verification System
．Breaking Power Limits to Accelerate Reliability Qualification
．Delivers over 30 dBm (1 W) output power, surpassing the conventional 26 dBm limitation
．Full Poincaré sphere polarization control with zero manual adjustment
．24/7 zero-drift stability, reducing reliability aging cycles by up to three months
．Optimized for parallel testing of DWDM multi-channel devices and PICs
Special Highlight
Dr. Joseph Liao, President & CTO of Enlitech, will deliver a technical presentation at the Silicon Photonics Global Summit on Monday, August 31. He will demonstrate how NightJar’s precise defect localization and FireFox’s accelerated reliability validation empower manufacturers to improve yield, streamline KGD screening, and capitalize on the market opportunities of the CPO era.
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