Enlitech to Exhibit at OFC 2026 | Booth 5055 | March 17–19, 2026 | Los Angeles Convention Center

Silicon photonics yield challenges often stem from optical loss mechanisms that electrical tests cannot capture. At OFC 2026, discover Night Jar™ — a high-sensitivity wafer-level optical loss mapping platform designed for:

• Silicon Photonics (SiPh)
• PIC wafer-level testing
• Optical observability in WAT
• Reliability and accelerated aging studies
• Process monitoring before packaging

See where light is lost — before yield is lost. Enlitech invites you to visit us at: 📍 Booth 5055 📅 March 17–19, 2026 📍 Los Angeles Convention Center If you are working on SiPh, optical device validation, ATE integration, or yield improvement, we welcome you to stop by and explore how Night Jar™ can support your work.