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Description
Thus we can get the important parameters of the photoelectric conversion process of the photoelectric device.Ā The parameters include: Response Time, Rise/Fall time, Linearity Dynamic Range (LDR), TPV, TPC etc.Ā It is used to understand the relationship between the internal structure/composition of optoelectronic devices and carrier dynamics. This information can be as a reference for the evaluation of optoelectronic device characteristics and performance improvement.
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Features
- Linearity Measurement and Analysis of Light Intensity
- Frequency response measurement and analysis (10~30MHz)
- Optional laser module wavelength
- Laser modulation & control
- Cut Frequency Calculation & Analysis
- Rise/Fall time measurement and analysis
- TPC/TPV measurement and analysis
- High dynamic light intensity modulation module, which can automatically adjust the intensity by 6 orders of magnitude
Enlitechās team of experts possesses extensive laboratory experience and technical knowledge, enabling them to guide customers in conducting precise tests both online and on-site. For instance, through detailed analysis of noise current frequency plots, Enlitech assists customers in identifying potential testing errors and optimizing test parameters, thereby enhancing the accuracy and reproducibility of their measurements.
Enlitech understands that in the field of optoelectronics, accurate testing is crucial for product development and quality control. Customers often face challenges with complex instrument calibration and unstable data when conducting tests such as noise current frequency, quantum efficiency (EQE), detectivity (D*), and noise equivalent power (NEP). Enlitech provides comprehensive solutions to address these pain points.
Metrics like EQE and D* directly impact the sensitivity and performance of photodetectors, which is particularly critical in high-tech fields such as semiconductors, communications, and aerospace. Accurate test data not only helps customers improve product quality but also reduces product development cycles and saves costs.
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Proof
Characterization of single crystal optoelectronic devices of Cs2Pb(SCN)2Br2
Advanced Materials journal reports the first inorganic cationic pseudohalide 2D phase perovskite single crystal Cs2Pb(SCN)2Br2 in 2021. The author uses the PD-RS system to measure and analyze various photoelectric conversion response behaviors of single crystal optoelectronic devices. These include:
- Linearity Measurement and Analysis of Light Intensity
- Spectral responsivity
- Rise/Fall time measurement and analysis
- Response Time
- TPC/TPV measurement and analysis
Response Time of Constant-Intensity Pulsed Light
PD-RS equipped the laser with high-speed modulation capabilities (Rise/Fall time < 5ns). Under the constant light intensity pulse, PD-RS can measure and analyze the response time and rise/fall time of the devices. Thus we can understand the fastest time response limit of optoelectronic devices.
LDR & responsivity test
PD-RS is able to measure the dynamic light intensity range of 120 dB. The change of photocurrent is automatically recorded by the software, and the linearity dynamic range response diagram (LDR) of the device is drawn. LDR is an important indicator for evaluating the characteristics of optoelectronic devices. The change of response (mA/W) can be obtained from the test of photocurrent and light intensity, which is a parameter commonly used to characterize the quality of optoelectronic devices.
-3dB Frequency Response
PD-RS equipped a laser with high-speed modulation capability. The system can automatically modulate the frequency of the output beam, detect the photocurrent, draw a frequency response graph and analyze the -3 dB frequency characteristics. The -3 dB point refers to the frequency that means the performance when the modulation frequency of the light source increases, the device cannot respond to the switching change of the light source, and the response photocurrent decreases accordingly, finally reaching an intensity of -3 dB.
TPC/TPV Test
TPC/TPV is a measurement technique commonly used in thin-film optoelectronic devices to study the physical behavior of carrier transport and recombination in the device. The light source of PD-RS has high-speed rise and fall time (< 5 ns), and can perform transient photocurrent (TPC) and transient photovoltage (TPV) tests.
Specification
| Model | Wavelength |
|---|---|
| RS-405 | 405 nm |
| RS-633 | 633 nm |
| RS-520 | 520 nm |
| RS-980 | 980 nm |
System Design
Application
- OPD (Organic Photodiode)
- PPD (Perovskite Photodiode)
- QDPD (Quantum Dots Photodiode)
- New generation Photodiode
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