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Description
Enlitech integrates three different testing functions within QE-RX and develops SQ-JVFLA software to help users analyze three different losses using the Shockley-Queisser thermal limit theory. QE-RX is your best partner for boosting PV efficiency.
EnlitechĀ introduces theĀ Spot-Viewer, a tool designed to help you effortlesslyĀ and accurately locate and observe spots, whether in a darkroom or a dimly lit lab environment.
Features
- For PESC, PERC, PERL, HJT, back-contact, bi-facial and TOP-Con Si solar cells
- Provide the data in QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE (incident photon-to-electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency), and Reflectance.
- Compact and High Repeatability over 99.5%
- wavelength range: 300~1200 nm
- Jsc Loss Analysis and report (with SQ-JVFLA software)
- Voc Loss Analysis and report (with SQ-JVFLA software)
- FF Loss Analysis and report (with SQ-JVFLA software)
- Variety and customized sample test fixtures.
Compact but Multi-functional
QE-RX integrates all optical and mechanical components within an 80cm x 80cm x 92cm main body, which includes electrical signal acquisition lock-in amplifiers. Despite its compact size, QE-RX provides a variety of test data, including EQE, Spectral Response, Reflectance, and IQE for solar cells. Being compact yet multifunctional are the advantages of QE-RX.
Power Loss Analyzing
QE-RX combines SQ-JVFL software, which can provide the most comprehensive analysis functions, including Jsc-loss, Voc-loss, FF-loss, and bandgap calculation. These parameters are key factors for controlling production yield and providing efficiency advice, making QE-RX the best partner for PV industries.
Proof
Specification
IPCE / Quantum Efficiency Testing
- For PESC, PERC, PERL, HJT, back contact, bifacial and TOP-Con silicon solar cells.
- Provides data on QE (quantum efficiency), PV-EQE (external quantum efficiency), IPCE(incident photon-electron conversion efficiency), SR (spectral response), IQE (internal quantum efficiency) and reflectivity.
- Equipment is with a compact structure and highly repeatability over 99.5%.
- Measuring wavelength range: 300~1200 nm
- Diversified and customized sample testing devices.
System Design
Application
- PERC/ HJT/ TOP-Con PV Solar Cell Efficiency-Loss Analysis
- IEC-60904-8 Spectral Response measurement
- IEC-60904-7 Mismatch Factor calculation
- IEC-60904-1 MMF Correction
- Si solar cell processing quality control
- Si solar cell bandgap determination
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