Description
Description
Specification
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Application
Characterization Module
Optional
Installation
Publication
Description
Explore the cutting-edge capabilities of the Enlitech SLX-P 3070, a state-of-the-art illuminator designed for advanced CMOS sensor development.
With an impressive dynamic range of over 140 dB and a precise collimation with a divergence angle of just 1 degree, the SLX-P 3070 sets new standards in semiconductor testing.
It is capable of conducting starlight-level tests, ideal for evaluating sensor performance under the lowest light conditions.
This compact and portable illuminator excels in applications such as Parametric Testing and Quality Inspection for CP and FT Testing, effectively measuring Quantum Efficiency, Overall System Gain, CRA, PDAF, and HDR, among other parameters. Whether youāre involved in research and development or quality control, the SLX-P 3070 is your perfect partner, providing accurate and reliable results across a wide range of lighting scenarios.
Features
Unmatched Dynamic Range for Superior Sensor Testing
The SLX-P 3070 is engineered to support high dynamic range imaging, achieving over 140 dB. Capable of handling extreme lighting conditions from 0.01 lux to over 100,000 lux, this illuminator is perfect for high-end CIS testing, ensuring detailed image capture in both very low and very high light scenarios.
Simulate Different Lighting Conditions
This illuminator can simulate a range of lighting conditions, from starlight to bright daylight, allowing for comprehensive sensor testing under all scenarios.
High Collimation for Precise PDAF Testing
Featuring high collimation with a minimal divergence angle of just 1 degree, the SLX-P 3070 provides focused light perfect for accurate PDAF testing, ensuring that photodiodes are precisely targeted for optimal performance.
Precision Light Control for Accurate Results
Featuring a minimal divergence angle of just 1 degree, our illuminator ensures that light is uniformly distributed, providing consistent test results. This precision is vital for applications that require exact light settings to mimic real-world conditions, particularly useful in parametric tests where every lux matters.
Compact, Portable, and Versatile
The SLX-P 3070 boasts a compact and portable design, making it highly versatile for various testing environments, whether in the lab or on the field.
Three Levels of Adjustable Intensity for Versatile Testing Environments
- High Intensity: Ranging from 900 to 1500 Lux with adjustments finer than 5 Lux, suitable for high-light scenarios.
- Median Intensity: Offering a range from 30 to 900 Lux with a step under 2 Lux, perfect for standard testing environments.
- Low Intensity: From 0 to 30 Lux with ultra-fine adjustment below 0.1 Lux, ideal for testing in low-light conditions.
Specification
| Specification | |
|---|---|
| Light Parallelism | Divergence angle of 1Ā° |
| Uniformity light Area | 30 mm x 30 mm ļ¼90% |
| Color Temperature | 4850K ~ 5500K |
| High Intensity | 900 ~ 1500 Lux Stepļ¼< 5 Lux |
| Median Intensity | 30 ~ 900 Lux Stepļ¼< 2 Lux |
| Low Intensity | 0 ~ 30 Lux Stepļ¼< 0.1 Lux |
| Dimension | 228mm*145mm*173mm |
| Weight | 1.9kg |
System Design
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Application
The newly developed SPD2200 by Enlitech is the worldās first commercial-grade characterization system for single photon detectors (SPDs).
It can be used to test and analyze the characteristics of single photon avalanche diodes (SPADs), a key component in LiDARs (Light Detection and Ranging). The SPD2200 meets customersā needs for measuring various parameters during the development of dToF modules.
The SPD2200 has two modules: (1) Spectral Characterization Module (SDTM) and (2) Time Domain Characterization Module (TDTM). Customers can choose to purchase either module for different measurement scenarios, or use both modules together for comprehensive characterization.
Customer Testimonials
SDTMćTDTM Characterization Module
(1) SDTM Spectral Characterization Module ā Equipment Specifications
| SDTM Spectral Characterization Module ā Equipment Specifications | |
|---|---|
| Continuous wave light source | 1.Stable light source system (xenon lamp) 2.Monochromator: 350-1100 nm, resolution 1nm, typical FWHM 10 nm; accuracy 0.6nm 3.Fiber coupling and optical diffuser: 5Ć5 mm or 10Ć10 mm beam, uniformity >99% at 25 mm working distance. (with 50 mm x 50 mm illumination spot) |
| Light source and beam delivery system | 1.Ultra-uniform silicon photodiode sensor, 10mm x 10mm active area, optically aged to eliminate instability 2.Wavelength range 350-1100nm, peak responsivity at 960nm 3.Traceable, certified calibration report to NIST (ISO 17025 certified, compliant to Spec 1) 4.Noise equivalent power of 1.5 x 10-14 W/āHz |
| Source stage | 1.Device biasing and measurement 2.Voltage range: > 200V 3.Current range: 1.5A max. 4.Minimum resolution: 100 nV, 10 fA |
| Photon detector | 1.Resolution: 100 ps 2.Count rate: > 300 MHz 3.Input voltage range: Ā± 5V |
| Measurable parameters | 1.Photon detection probability over spectrum 2.Dark counts 3.External quantum efficiency over spectrum 4.Breakdown voltage 5.Spectral responsivity over spectrum |
(2) TDTM Time Domain Characterization Module
| TDTM Time Domain Characterization Module | |
|---|---|
| PS Laser | 1.Wavelength 940 nm 2.FWHM <90 ps 3.MAX rep. rate: 80 MHz (adjustable) |
| T-counter | 1.Detection Channel: 4 Chs 2.BIN Resolution: 5 ps 3.Time-tagging and time-resolved modes |
| Measurable Parameters | 1.Jitter 2.Diffusion Tail 3.Signal-to-Noise Ratio |
| controller | āIndustrial Computer āScreen āKeyboard and Mouse |
|---|
Publication
Optional items
| Optional items | |
|---|---|
| Probe station | 1.Three styles: fully automatic / semi-automatic / manual 2.Suitable for wafer level sample measurement 3.Please contact us |
| Customized test fixture | 1.Suitable for module type sample measurement 2.Please contact us |
| Custom camera obscura | 1.The camera obscura has a noise shielding function 2.Please contact us |
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