Description
Description
Specification
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Application
Characterization Module
Optional
Installation
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Description
In the process of testing and developing semiconductor sensors, choosing a professional light source that integrates perfectly with the testing equipment is key to improving efficiency and precision. The SLX-U 25085 illuminator not only meets these needs but is specifically designed for seamless integration with the Teradyne j750 test machine, ensuring optimal testing environment performance. This advanced illuminator is especially suitable for tests requiring extremely low lighting conditions, such as starlight-level environments, and can provide a wide range of light intensity adjustments from 0.1 Lux to 10,000 Lux, perfectly meeting the demands for high-precision testing.
To ensure accuracy and consistency in these challenging low-light conditions, the SLX-U 25085 provides a large uniform light area (250mm x 85mm) with over 99% stability in spectrum and intensity. This design not only allows engineers to rely on it for stable and consistent results during high-precision sensor performance evaluations but also makes integration with the Teradyne j750 test machine seamless, enhancing the overall testing process efficiency.
For professional engineers working in the CIS field, the professional design and perfect integration of the SLX-U 25085 with the Teradyne j750 mean they can more precisely simulate and test sensor behavior in real-world applications. This not only enhances the efficiency of product development but also ensures the quality and reliability of the final products. The SLX-U 25085 is an indispensable tool, designed for those seeking the utmost precision and reliability in their testing environments.
Features
Seamless Integration with Teradyne j750 Tester
Specifically designed for integration with the Teradyne j750 test machine, the SLX-U 25085 ensures a seamless and efficient testing process. This integration facilitates accurate and consistent performance, crucial for high-stakes semiconductor testing.
Starlight-Level Illumination for Ultra-Low Light Testing
The SLX-U 25085 offers starlight-level illumination, capable of providing light conditions as low as 0.1 Lux, ideal for testing sensors in ultra-low light scenarios. This feature is perfect for applications requiring extreme sensitivity and precision.
High Stability in Spectrum and Intensity
Designed to maintain over 99% stability in both spectrum and intensity, the SLX-U 25085 delivers reliable and consistent results, even under extremely low brightness conditions. This high stability is essential for achieving accurate sensor calibration and testing.
Large Uniform Light Area
With a uniform light area measuring 250mm x 85mm and greater than 90% uniformity, the SLX-U 25085 ensures that the entire testing area is evenly illuminated, minimizing any variations that can affect the accuracy of test results.
Wide Range of Light Intensity
The illuminator provides a wide range of adjustable light intensity from 0.1 to 10,000 Lux, allowing for flexible adaptation to various testing requirements and conditions.
Exceptional Luminous Accuracy for Precision Testing
The SLX-U 25085 illuminator achieves an exceptional luminous accuracy of Ā±1%, ensuring precise light output for every test. This level of precision is critical for applications where even slight variations in light intensity can affect the outcome of sensor calibration and performance evaluation. With this high degree of accuracy, the SLX-U 25085 becomes an indispensable tool in semiconductor testing, particularly in environments demanding strict adherence to specified light conditions.
Specification
| Uniformity light Area | 250mm x 85mmļ¼90% |
|---|---|
| Light Intensity | 0.1 ~ 10000 Lux |
| Luminous Accuracy | Ā±1% |
| Color Temperature | 4850K ~ 5500K |
| R/G and B/G variation | < Ā± 1.0 % |
| Dimension | 290mm x 110mm x 40mm |
System Design
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Application
The newly developed SPD2200 by Enlitech is the worldās first commercial-grade characterization system for single photon detectors (SPDs).
It can be used to test and analyze the characteristics of single photon avalanche diodes (SPADs), a key component in LiDARs (Light Detection and Ranging). The SPD2200 meets customersā needs for measuring various parameters during the development of dToF modules.
The SPD2200 has two modules: (1) Spectral Characterization Module (SDTM) and (2) Time Domain Characterization Module (TDTM). Customers can choose to purchase either module for different measurement scenarios, or use both modules together for comprehensive characterization.
Customer Testimonials
SDTMćTDTM Characterization Module
(1) SDTM Spectral Characterization Module ā Equipment Specifications
| SDTM Spectral Characterization Module ā Equipment Specifications | |
|---|---|
| Continuous wave light source | 1.Stable light source system (xenon lamp) 2.Monochromator: 350-1100 nm, resolution 1nm, typical FWHM 10 nm; accuracy 0.6nm 3.Fiber coupling and optical diffuser: 5Ć5 mm or 10Ć10 mm beam, uniformity >99% at 25 mm working distance. (with 50 mm x 50 mm illumination spot) |
| Light source and beam delivery system | 1.Ultra-uniform silicon photodiode sensor, 10mm x 10mm active area, optically aged to eliminate instability 2.Wavelength range 350-1100nm, peak responsivity at 960nm 3.Traceable, certified calibration report to NIST (ISO 17025 certified, compliant to Spec 1) 4.Noise equivalent power of 1.5 x 10-14 W/āHz |
| Source stage | 1.Device biasing and measurement 2.Voltage range: > 200V 3.Current range: 1.5A max. 4.Minimum resolution: 100 nV, 10 fA |
| Photon detector | 1.Resolution: 100 ps 2.Count rate: > 300 MHz 3.Input voltage range: Ā± 5V |
| Measurable parameters | 1.Photon detection probability over spectrum 2.Dark counts 3.External quantum efficiency over spectrum 4.Breakdown voltage 5.Spectral responsivity over spectrum |
(2) TDTM Time Domain Characterization Module
| TDTM Time Domain Characterization Module | |
|---|---|
| PS Laser | 1.Wavelength 940 nm 2.FWHM <90 ps 3.MAX rep. rate: 80 MHz (adjustable) |
| T-counter | 1.Detection Channel: 4 Chs 2.BIN Resolution: 5 ps 3.Time-tagging and time-resolved modes |
| Measurable Parameters | 1.Jitter 2.Diffusion Tail 3.Signal-to-Noise Ratio |
| controller | āIndustrial Computer āScreen āKeyboard and Mouse |
|---|
Publication
Optional items
| Optional items | |
|---|---|
| Probe station | 1.Three styles: fully automatic / semi-automatic / manual 2.Suitable for wafer level sample measurement 3.Please contact us |
| Customized test fixture | 1.Suitable for module type sample measurement 2.Please contact us |
| Custom camera obscura | 1.The camera obscura has a noise shielding function 2.Please contact us |
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