Tell us more, we’ll 

Enlighten Your Ideas!

Science News: 2022 ACS Energy Lett., Impact of van der Waals Metal Contacts on Optoelectronic Applications of Metal Halide Perovskite Thin Films

  Jin-Wook Lee et al. of Sungkyunkwan University, Korea, recently published a study in ACS Energy Letters (IF23.101). The metal contacts on metal halide perovskite thin films are usually formed by physical vapor deposition (PVD) processes for studying the properties of thin films or for construction of optoelectronic devices. (Note: PVD refers to a technology that uses physical processes to deposit thin films without chemical reactions. Commonly used technologies are cathode sputtering and vacuum evaporation deposition.) However, the PVD process generates high-energy metal atoms that directly bombard the film surface and may cause unexpected damage to the film. In this study, the authors systematically investigated the impact of a PVD- processed metal contacts on the optoelectronic properties of underlying organic-inorganic hybrid perovskite thin films.

  The authors used physically laminated van der Waals metal contact for comparison for quantitative analysis. The results of the study found:

  1. Through space-charge-limited current measurement, it was demonstrated that the defect density increased by an average of 26-48% after forming metal contact through the PVD process.
  2. In-situ photoluminescence measurements show that the resulting defects can easily migrate under the electric field, which can seriously affect the performance and stability of photodetectors.

  This study highlights the importance of the integrity of the intact junction between perovskite and metal contacts for the characterization and optoelectronic application of perovskite thin films.


Impact of van der Waals Metal
Atomic force microscopy (AFM) images
Atomic force microscopy (AFM) images of (a) FAPbI3 (Root-meat-square roughness,Ra=6.4 nm) and (b) MAPbI3 (Ra=7.0 nm) thin films. (c) Statistical distributions of grain size for both films. (d) The thickness line scans for both films.
J–V curves of perovskite films with TdCl treatment at different molar concentration under AM 1.5G 100 mW cm2 illumination

Forward(-F)/reverse(-R) I-V characteristics of (a) ITO/FAPbI3/Au devices and (b) ITO/MAPbI3/Au devices with different metal contacts (red line: EVC, blue line: vdWC) under continuous voltage bias with different scan rate from 0.006 V/s to 0.6 V/s.

Key Word: metal halide perovskite, physical vapor deposition, photodetector

Article link:https://doi.org/10.1021/acsenergylett.2c01510

Recommend Instruments

Van der Waals Metal Contacts for Characterization

Leave a Reply

Scroll to Top
Join Our Newsletter
Subscribe now to Enlitech Light Simulator and Quantum Efficiency newsletter.