关于光焱科技
光焱科技致力于提供测试解决方案,使光学传感器变得更好。主要目标是提高我们客户产品的核心竞争力。这些传感器测试解决方案包括晶圆级图像传感器光电子特性测试,晶圆级光学传感器量子效率测试,环境光传感器测试,CIS模块检测,5G光通信中的光接收器测试,dToF光电探测器测试等。
高SCI影响因子期刊接受的论文数量排名
使用Enlitech系统发表的论文
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产品表格
Application / Solutions | Photon-to-Electron Spectroscopy (time-domain / frequency-domain / wavelength-domain) | Light Simulator |
---|---|---|
CMOS Image Sensor (CIS) Module / Camera | SG-A | SG-FPX |
CMOS Image Sensor (CIS) on Wafer | SG-A (w/o prober) SG-O (w/t prober) | SG-FPX |
Scienctific / Aerospace Image Sensor and Camera | SG-U | |
Fingerprint on Display (FoD) – CIS Sensor | SG-A SG-MPX | |
Fingerprint on Display (FoD) – TFT Array Sensor | SG-A SG-MPX | |
Evant Camara | SG-A-W |
Application / Solutions Photon-to-Electron Spectroscopy
(time-domain / frequency-domain / wavelength-domain)Light Simulator
PV / Solar Cell External Quantum Efficiency QE-R
Incident Photon-Electron Conversion
Efficiency (IPCE)QE-R
PV Power Conversion Efficiency (PCE) and
Current – Voltage (IV) TestSS-X series & KA-6000
NREL Asymptotic Measurement SS-X series & KA-6000
PV carrier lifetime and Transport Testing
(TPC / TPV)TPC/TPV
PV PCE and IV in Room-Light Condition ILS-30 & HS-IL & KA-6000
Perovskite Solar Cell IV and Power Conversion
Efficiency (PCE) TestSS-X50 & KA-6000
Water-Splitting Cell Test QE-R SS-X50 & KA-6000
ALS-300
Perovskite and Organic PV Voc Loss Analysis REPS & SQ-VLA
Perovskite Solar Cell Trap State Testing FTPS
Organic Solar Cell Charge Transfer State
(CTS) TestFTPS
HJT / PERC / TOP-Con Cell Loss Analysis
(Current, Voltage, Fill-Factor Losses)QE-RX & SQ-JVFLA SS-X200R
PV Ideality Factor Auto Testing SS-X series & KA-6000
Application / Solutions Photon-to-Electron Spectroscopy
(time-domain / frequency-domain / wavelength-domain)Light Simulator
Photodetector / Photoreciever Spectral
Response and DetectivityPD-QE
APD-QE
Organic Photodetector Spectral Response
and DetectivityPD-QE
Perovskite Photodetector PD-QE
Photo-Transistor
(Three or Four-Terminals)APD-QE
InGaAs Photodetector APD-QE
Photodetector Response Speed PD-RS