描述
描述
規格
應用
聯絡我們
特性量測模組
選配
客戶裝機
出版
描述
ARS（Angular Response System）是針對各種光感測器的角度分佈特性的測試系統。 該系統由一個高度准直和平行的類比光源（發散角 < 0.1°）組成，該光源將直徑大於或等於 25mm 的高均勻性光斑投射到被測光感測器上。 該系統配備了角度測試，角度解析度小於 0.1°，工作範圍為 -90° 至 90°。 系統軟體可以自動繪製角度分佈和光回應曲線，使其成為開發各種光感測器模組結構的最佳工具。
- 高準直高平行模擬光源（發散角 < 0.1°）
- 投射的高均勻度光斑直徑大於等於25mm
- 角度測試工作範圍由-90°~90°
- 角度解析度小於0.1°
特徵
- 高準直高平行模擬光源（發散角 < 0.1°）
- 投射的高均勻度光斑直徑大於等於25mm
- 角度測試工作範圍由-90°~90°
- 角度解析度小於0.1°
規格
| Specification | |
|---|---|
| Light Parallelism | Divergence angle of 1° |
| Uniformity light Area | 30 mm x 30 mm ＞90% |
| Color Temperature | 4850K ~ 5500K |
| High Intensity | 900 ~ 1500 Lux Step：< 5 Lux |
| Median Intensity | 30 ~ 900 Lux Step：< 2 Lux |
| Low Intensity | 0 ~ 30 Lux Step：< 0.1 Lux |
| Dimension | 228mm*145mm*173mm |
| Weight | 1.9kg |
實證
ARC角度分布圖
系統設計
應用
應用範圍
- TFT Sensor
- ALS
- FoD
- SPAD
客戶實證
聯繫我們
SDTM、TDTM 表徵模組
（1） SDTM 光譜表徵模組 – 設備規格
| SDTM Spectral Characterization Module – Equipment Specifications | |
|---|---|
| Continuous wave light source | 1.Stable light source system (xenon lamp) 2.Monochromator: 350-1100 nm, resolution 1nm, typical FWHM 10 nm; accuracy 0.6nm 3.Fiber coupling and optical diffuser: 5×5 mm or 10×10 mm beam, uniformity >99% at 25 mm working distance. (with 50 mm x 50 mm illumination spot) |
| Light source and beam delivery system | 1.Ultra-uniform silicon photodiode sensor, 10mm x 10mm active area, optically aged to eliminate instability 2.Wavelength range 350-1100nm, peak responsivity at 960nm 3.Traceable, certified calibration report to NIST (ISO 17025 certified, compliant to Spec 1) 4.Noise equivalent power of 1.5 x 10-14 W/√Hz |
| Source stage | 1.Device biasing and measurement 2.Voltage range: > 200V 3.Current range: 1.5A max. 4.Minimum resolution: 100 nV, 10 fA |
| Photon detector | 1.Resolution: 100 ps 2.Count rate: > 300 MHz 3.Input voltage range: ± 5V |
| Measurable parameters | 1.Photon detection probability over spectrum 2.Dark counts 3.External quantum efficiency over spectrum 4.Breakdown voltage 5.Spectral responsivity over spectrum |
（2） TDTM 時域表徵模組
| TDTM Time Domain Characterization Module | |
|---|---|
| PS Laser | 1.Wavelength 940 nm 2.FWHM <90 ps 3.MAX rep. rate: 80 MHz (adjustable) |
| T-counter | 1.Detection Channel: 4 Chs 2.BIN Resolution: 5 ps 3.Time-tagging and time-resolved modes |
| Measurable Parameters | 1.Jitter 2.Diffusion Tail 3.Signal-to-Noise Ratio |
| controller | ●Industrial Computer ●Screen ●Keyboard and Mouse |
|---|
出版
選購配件
| Optional items | |
|---|---|
| Probe station | 1.Three styles: fully automatic / semi-automatic / manual 2.Suitable for wafer level sample measurement 3.Please contact us |
| Customized test fixture | 1.Suitable for module type sample measurement 2.Please contact us |
| Custom camera obscura | 1.The camera obscura has a noise shielding function 2.Please contact us |
商品評價
目前沒有評價。