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Overview: Silicon Photonics Wafer-Level Test Solutions for AI and CPO Applications
Driven by the escalating bandwidth demands of AI servers and modern data centers, the transition toward optical interconnects and Co-Packaged Optics (CPO) has become an industry imperative. However, with the increasing complexity of heterogeneous integration, accurately screening for Known Good Die (KGD) prior to advanced packaging is now a critical prerequisite for effective yield management and mitigating subsequent packaging losses.
Enlitech’s NightJar™ Silicon Photonics Wafer-Level Test Solution is engineered to overcome the bottlenecks of PIC defect feature detection, anomaly coordinate localization via Hyperspectral Inspection Technology, and testing throughput in SiPh high-volume manufacturing. The system supports comprehensive O-to-O (Optical-to-Optical) evaluations and integrates seamlessly with customers’ existing automated probers, facilitating a highly efficient automated test flow from the R&D lab to the production floor.
Comprehensive On-Wafer Test Coverage from WAT, CP to FT
NightJar™ is a highly versatile test platform capable of upgrading existing electrical probe stations into systems with advanced optical testing capabilities, supporting the full lifecycle testing requirements of silicon photonics chips:
- WAT (Wafer Acceptance Test): Performs optical and electrical parameter acceptance testing on PCM structures before wafer shipment.
- CP (Chip Probing): Executes wafer-level functional testing to perform KGD screening, reducing scrap costs in backend advanced packaging (e.g., CoWoS, CPO).
- FT (Final Test): Verifies the final optical performance of diced or packaged SiPh modules.
Supported Wafer Sizes and Test Phases
Test phases: WAT wafer acceptance, CP probing, FT final test
The system supports the integration and upgrade of various mainstream probers and ATEs (Automated Test Equipment) for silicon photonic chips. It has extensive multi-brand integration and upgrade capabilities, supporting brands like TEL, Accretech, Formfactor, Advantest, and MPI.
4–12 inch silicon photonics wafer test support
Compatible with various wafer sizes ranging from 4 to 12 inches.
System design
Applications
As a PIC wafer-level optical testing system and silicon photonics wafer test platform, Night Jar™ is suitable for SiPh, PIC and CPO device characterization across multiple process and packaging stages. It can be deployed in IC design houses, foundries and OSATs as a co-packaged optics silicon photonics wafer testing solution, enabling earlier optical screening and continuous process monitoring.
- Technologies: PIC, SiPh, CPO, CoWoS, CoPos, CoWoP.
- Industry Segments: IC Design, Foundry, OSAT.
- Test Phases: WAT, CP, FT.
1. Device-Level Optical Performance
Night Jar™ supports key optical performance measurements required for silicon photonics device characterization, completely bypassing conventional testing limitations:
- Insertion Loss (IL)
- Return Loss (RL)
- Coupling Efficiency
- Waveguide Propagation Loss
- Crosstalk
2. Wafer-Level & Process Analytics
Night Jar™ enables wafer-scale optical characterization and process correlation analysis to support yield optimization and process control:
- Wafer-Level Defect Mapping
- Coupling Angle Response (CRA)
- Process Variation Correlation
- PIC Long-Term Stability Validation & Aging Test
3. System-Level Characteristics
Night Jar™ also supports system-level optical link evaluation that complements device-level testing:
- Optical Link Loss
- Polarization Dependent Loss (PDL)
- Frequency Response / Bandwidth
- Latency and Dispersion
Publications
Yi Yang, Bowei Xu, Jianhui Hou
First published: 15 November 2023 https://doi.org/10.1002/smll.202306668
… the devices were recorded on a source measurement unit, and the measurement was carried out under AM 1.5G illumination based on a class A+AA+ solar simulator (Enlitech SS-X50) …
Reference to:SS-X50
Fengxuan Chen , Xin Hu , Longhao Jisi , Liping Su, Huiyao Zhao , Yanbei Wei , Rui Zhou , Yangdi Chen , Jun Qu , Yonglian Xiong , Mao Liang , Wenfeng Zhang
Volume 38, March 2024, 108552 https://doi.org/10.1016/j.mtcomm.2024.108552
… (Enli Tech, SS-F5–3A, Taiwan). The external quantum efficiency (EQE) spectra and integral current densities in the wavelength range of 300 ∼ 850 nm were measured using an EQE …
Reference to:SS-F5-3A
Naba Kumar Rana*, Dhruv Pratap Singh, and Nikhil Chander*
Publication Date:April 17, 2024 https://doi.org/10.1021/acsaelm.4c00182
… The photocurrent–voltage (J–V) characteristics curve was measured using a Keithley 2450 source meter, an Enli-Technology Co, Ltd. (Model No-SS-F5–3A, Taiwan) solar simulator …
Reference to:SS-F5-3A、Model No-SS-F5–3A
Defect passivation with bromine template for efficient perovskite solar cells
Zhuowei Du, Zhu Ma, Qianyu Liu, Zhangfeng Huang, Tangjie Yu, Yanlin Li, Shanyue Hou, Yi Chen, Qiang Yang, Wei You, Junbo Yang, Guoming Li, Jingjing Xu, Hao Du, Yixian Li, Zichen Liu, Yuelong Huang, Jian Yu, Kuan Sun, Yaohua Mai, Rong Su
Volume 173, April 2024, 108138 https://doi.org/10.1016/j.mssp.2024.108138
… simulator (Enli Tech, SS-F5-3A, Taiwan) in glovebox. The active area of PSCs was 0.105 cm 2 . The maximum power point tracking (MPPT) stability test is continuously tested under the …
Reference to:SS-F5-3A
A Direct Chemical Approach to Mitigate Environment Lead Contamination in Perovskite Solar Cells
by Benjamin Liu, Zihan Jia and Zhiliang Chen *
Published: 28 March 2024 https://doi.org/10.3390/en17071629
… (100 mW/cm2), courtesy of the SS-F5-3A solar simulator from Enli Technology, Co., Ltd. (Taiwan, China). The measurement took place in ambient conditions and at room temperature. …
Reference to:SS-F5-3A
Naba Kumar Rana, Manas R. Samantaray, Dhruv Pratap Singh Nikhil Chander
Published: 08 January 2024 https://doi.org/10.1007/s00339-023-07243-3
… (AM 1.5G, 1000 W/m 2 ) using a solar simulator system (Enli-Technology Co. Ltd, Model No.-SS-F5-3A, Taiwan). The intensity of the light was calibrated using a standard reference …
Reference to:SS-F5-3A、Model No.-SS-F5-3A
Efficient micrometer-scale thick-film perovskite solar cells with superior stability
Jian-Fei Hu, Gang Chen, Shun-Zhang Yu, Yue-Xin Lin, Kai-Yu Wang, Zong-Wei Li, Guo-Dong Zhang, Teng-Fei Pan, Ya-Jing Li, Ming-Jie Li, Ying-Dong Xia, Yi-Fan Lv Yong-Hua Chen
Published: 29 December 2023 https://doi.org/10.1007/s12598-023-02529-0
… A Keithley 2400 source meter and an Enlitech SS-F5-3A solar simulator (Enli Tech,
Taiwan, China) were used to test the devices. NIST-certified monocrystalline Si solar cell (Newport …
Reference to:SS-F5-3A
Tapas Das, Arun Kumar, Sonia Rani, Asim Guchhait, Dhriti Sundar Ghosh
First published: 20 February 2024 https://doi.org/10.1002/adem.202302078
… 5G (100 mW/cm2) intensity sunshine solar simulator was used to capture the JV curves (Enli-Technology Co, Ltd, Model No – SS-F5-3A, Taiwan). A reference silicon cell that meets …
Reference to:SS-F5-3A、Model No – SS-F5-3A
Introducing back-surface field for efficient inverted CsPbI3 perovskite solar cells
Chunyan Lu, Xiaodong Li, Haobo Yuan, Wenxiao Zhang, Xuemin Guo, Acan Liu, Hui Yang, Wen Li, Zhengbo Cui, YuYang Hu, Junfeng Fang
Volume 480, 15 January 2024, 147267 https://doi.org/10.1016/j.cej.2023.147267
… (Enlitech, SS-F5-3A) with simulated AM 1.5G illumination (100 mW cm −2 ). The light source is a 450-W xenon lamp calibrated by a standard Si reference solar cell (Enli/SRC2020, SRC– …
Reference to:SS-F5-3A、SRC2020
Qiaojing Xu, Biao Shi, Yucheng Li, Jingjing Liu, Yuxiang Li, Zetong SunLi, Pengfei Liu, Yubo Zhang, Cong Sun, Wei Han, Qian Huang, Dekun Zhang, Huizhi Ren, Xiaona Du, Ying Zhao, Xiaodan Zhang
First published: 08 November 2023 https://doi.org/10.1002/adma.202308692
… source meter under AM 1.5G illumination with a xenon-lamp-based solar simulator (Enli. Tech., SSF5-3A). The light intensity was calibrated to 100 mW/cm2 by a standard silicon cell …
Reference to:SSF5-3A
Efficient inverted CsPbI3 perovskite solar cells fabricated in common air
Chunyan Lu , Xiaodong Li , Xuemin Guo , Sheng Fu , Wenxiao Zhang , Haobo Yuan , Junfeng Fang
Volume 452, Part 3, 15 January 2023, 139495 https://doi.org/10.1016/j.cej.2022.139495
… , SS-F5-3A) with simulated AM 1.5G illumination (100 mW cm −2 ). The light source is a 450-W xenon lamp calibrated by a standard Si reference solar cell (Enli… (Enlitech, SS-F5-3A) with …
Reference to:SS-F5-3A
RETRACTED: Interfacial passivation by Mono-ethanolamine in planar perovskite solar-cell
Naba Kumar Rana , Pijus Kanti Samanta
Volume 348, 1 October 2023, 134689 https://doi.org/10.1016/j.matlet.2023.134689
… 5G (100 mW/cm2) intensity sunlight solar simulator (Enli-Technology Co, Ltd, Model No-SS-F5-3A, Taiwan). The intensity of the light was calibrated using a Contents lists available at …
Reference to:SS-F5-3A、Model No-SS-F5-3A
Yi-Nuo Yang, Xiao-Ming Li, Shi-Jie Wang, Xiao-Peng Duan, Yun-Hao Cai, Xiao-Bo Sun, Dong-Hui Wei, Wei Ma Yan-Ming Sun
Published: 20 October 2022 https://doi.org/10.1007/s10118-022-2860-8
… (Enli Technology Co., Ltd., SS-F5-3A). The representative current density-voltage (J-V) curves for optimized OSCs are illustrated in Fig. 2(a), and the corresponding photovoltaic …
Reference to:SS-F5-3A
Iodine-trapping strategy for light-heat stable inverted perovskite solar cells under ISOS protocols
Xiaodong Li, Hui Yang, Acan Liu, Chunyan Lu, Haobo Yuan, Wenxiao Zhang and Junfeng Fang
First published 07 Nov 2023 DOI https://doi.org/10.1039/D3EE03405D
… To calibrate the initial illumination intensity to 100 mW cm −2 , the PSC is first measured under a solar simulator (Enlitech, SS-F5-3A) with simulated AM 1.5G illumination (450 W xenon …
Reference to:SS-F5-3A
Wenyan Zheng, Pengcheng Li, Chenhao Wang, Xvsheng Qiao, Guodong Qian, Xianping Fan
Volume 599, 1 January 2023, 121910 https://doi.org/10.1016/j.jnoncrysol.2022.121910
… The current density-voltage (JV) curves of OSCs were tested on Keithley 2400, under AM 1.5 G by an Enli SS-F5–3A solar simulator whose light intensity was calibrated with a standard …
Reference to:SS-F5-3A
Seoungjun Ahn , Wei-Hao Chiu , Hsin-Ming Cheng , Vembu Suryanarayanan , Gao Chen , Yu-Ching Huang , Ming-Chung Wu , Kun-Mu Lee
Volume 120, September 2023, 106847 https://doi.org/10.1016/j.orgel.2023.106847
… The AM 1.5G solar simulator (SS-F5-3A, ENLI Technology Co. Ltd. ) was used as the irradiation light source for the current density–voltage (J–V) measurements. The illumination …
Reference to:SS-F5-3A
Kangrong Yan, Ziqiu Shen, Benfang Niu, Yanchun Huang, Di Wang, Emely Gu, Buyi Yan, Jizhong Yao, Hongzheng Chen Chang-Zhi Li
Published: 10 May 2023 https://doi.org/10.1007/s11426-023-1596-9
… from Enli Technology (Enlitech, SS-F5-3A), and the light intensity was calibrated with a certified standard photovoltaic reference cell (SRC2020, Enlitech). The JV measurements were…
Reference to:SS-F5-3A、SRC2020
Naba Kumar Rana, Arun Kumar, Nikhil Chander, and Dhriti Sundar Ghosh *
Publication Date:January 23, 2023 https://doi.org/10.1021/acsaelm.2c01552
… 5G (100 mW/cm 2 ) intensity sunlight solar simulator (Enli-Technology Co, Ltd, Model No – SS-F5-3A, Taiwan). The intensity of the light was calibrated using a standard reference silicon …
Reference to:SS-F5-3A、Model No – SS-F5-3A
Tapas Das , Naba Kumar Rana and Asim Guchhait
Published 20 June 2023 https://doi.org/10.1088/1402-4896/acdc65
… 5G (100 mW cm −2 ) intensity Sunshine solar simulator was used to capture the JV curves (Enli-Technology Co, Ltd., Model No – SS-F5–3A, Taiwan). A reference silicon cell that meets …
Reference to:SS-F5-3A、Model No – SS-F5–3A
Gelation of hole transport layer to improve the stability of perovskite solar cells
Ying Zhang, Chenxiao Zhou, Lizhi Lin, Fengtao Pei, Mengqi Xiao, Xiaoyan Yang, Guizhou Yuan, Cheng Zhu, Yu Chen Qi Chen
Published: 10 July 2023 https://doi.org/10.1007/s40820-023-01145-y
… 5G illumination at 1000 W m −2 solar simulator (SS-F5-3A, Enlitech). The JV scan method was by reverse scanning from 1.2 to − 0.2 V or forward scanning from − 0.2 to 1.2 V at a …
Reference to:SS-F5-3A
Rui Liu, Yue Yu, Chang Liu, Hua Yang, Xiao-Lei Shi, Hua Yu Zhi-Gang Chen
Published: 09 October 2022 https://doi.org/10.1007/s11426-022-1349-6
… Simulated solar illumination was provided by an AAA Class Solar Simulator (Enli Tech, SS-F5-3A, Taiwan, China) with AM1.5G spectrum and light intensity of 100 mW cm …
Reference to:SS-F5-3A
Intrinsically inert hyperbranched interlayer for enhanced stability of organic solar cells
Yawen Li, Tengfei Li, Jiayu Wang, Xiaowei Zhan, Yuze Lin
Volume 67, Issue 2, 30 January 2022, Pages 171-177 https://doi.org/10.1016/j.scib.2021.09.013
… The current density–voltage (J–V) characteristics were measured under AM 1.5G spectrum from a solar simulator (Enlitech model SS-F5-3A) and a Keithley 2450 source-measure unit. …
Reference to:SS-F5-3A
Small molecule interfacial cross-linker for highly efficient two-dimensional perovskite solar cells
Hongming Hou, Taotao Hu, Fu Zhang, Rui Liu, Jialong He, Chang Liu, Yue Yu, Dong Chen, Qiaofeng Wu, Meng Zhang, Hua Yu
Volume 68, May 2022, Pages 35-41 https://doi.org/10.1016/j.jechem.2021.10.026
… The photocurrent density–voltage (JV) curves of devices were acquired using a Keithley B2901A SourceMeter and AAA Class Solar Simulator (SS-F5-3A, Enli Technology Co., Ltd.), …
Reference to:SS-F5-3A
Heterogeneous lead iodide obtains perovskite solar cells with efficiency of 24.27%
Qianyu Liu, Zhu Ma, Yanlin Li, Guangyuan Yan, Dejun Huang, Shanyue Hou, Weiya Zhou, Xin Wang, Jie Ren, Yan Xiang, Rui Ding, Xuelin Yue, Zhuowei Du, Meng Zhang, Wenfeng Zhang, Lianfeng Duan, Yuelong Huang
Volume 448, 15 November 2022, 137676 https://doi.org/10.1016/j.cej.2022.137676
… The simulated sunlight was offered by the AAA solar simulator (SS-F5-3A, Enli Technology Co., Ltd.). With the AM1.5 G spectrum, the intensity of the solar simulator was calibrated to …
Reference to:SS-F5-3A
Manas R. Samantaray, Naba Kr. Rana, Arun Kumar, Dhriti S. Ghosh, Nikhil Chander
First published: 02 September 2021 https://doi.org/10.1002/er.7243
… The current density-voltage (J-V) curves of PSCs were recorded using a class AAA solar simulator (Enli-Technology Co. Ltd, Model No-SS-F5-3A, Taiwan ).
The devices were measured …
Reference to:SS-F5-3A、Model No-SS-F5-3A
Yu-Xuan Liu, Liang Wang, Ke Zhou, Hong-Bo Wu, Xiao-Bo Zhou, Zai-Fei Ma, Sheng-Wei Guo Wei Ma
Published: 21 June 2022 https://doi.org/10.1007/s10118-022-2759-4
… J-V characteristic was measured in the N2 glovebox under AM 1.5G (100 mW·cm−2) using an AAA solar simulator (SSF5-3A, Enli Technology Co., Ltd.) calibrated with a standard …
Reference to:SS-F5-3A
Large-area Si solar cells based on molybdenum oxide hole selective contacts
Manas R. Samantaray, Tushar Chichkhede, Dhriti S. Ghosh Nikhil Chander
Published: 23 February 2022 https://doi.org/10.1007/s12633-022-01743-2
… class AAA solar simulator (Enli-Technology Co. Ltd., Model No- SS-F5-3A, Taiwan ) having a…
… using a quantum efficiency measurement system (Enli-Technology Co. Ltd. Model No-QE-R …
Reference to:SS-F5-3A、Model No- SS-F5-3A、Model No-QE-R
Ligand exchange engineering of FAPbI3 perovskite quantum dots for solar cells
Wentao Fan, Qiyuan Gao, Xinyi Mei, Donglin Jia, Jingxuan Chen, Junming Qiu, Qisen Zhou Xiaoliang Zhang
Published: 23 September 2022 https://doi.org/10.1007/s12200-022-00038-z
… 5G, 100 mW/cm 2 ) provided by a solar simulator (Enli Technology Co., Ltd. SS-F5-3A ), the …
… The external quantum efficiency (EQE) spectrum was measured using an Enli Technology …
Reference to:SS-F5-3A
α-Phase intermediate for efficient and stable narrow bandgap triple cation perovskite solar cells
Lin Du, Changtao Peng, Qian Chen, Yu Tang, Hui Su, Wenfeng Zhang, Haijin Li, Qiyun Wang, Yan Xiang, Liuwen Tian, Puan Lin, Shenghou Zhou, Yuelong Huang
Volume 910, 25 July 2022, 164722 https://doi.org/10.1016/j.jallcom.2022.164722
… (Enli Tech, SS-F5–3A, Taiwan), which was calibrated by a standard silicon solar cell. The JV characteristics were recorded sweeping the voltage from forward bias to short circuit …
Reference to:SS-F5-3A
by Qiaofeng Wu , Taotao Hu, Chang Liu, Yue Yu, Hongming Hou, Rui Liu, Meng Zhang, and Hua Yu*
Publication Date:February 10, 2022 https://doi.org/10.1021/acs.jpcc.2c00283
… Illumination was provided by an AAA Class Simulator (SS-F5-3A, Enli Technology Co., Ltd.) under AM 1.5G spectrum and a light intensity of 100 mW/cm 2 . In addition, the light intensity…
Reference to:SS-F5-3A
Accessories
Reference Cells
Enlitech provides the world’s most comprehensive selection of reference cells, compliant with WPVS types and IEC 60904 standards. The purpose of reference cells is to assist in accurate solar cell characterization, keeping pace with the rapid development of various emerging solar cell technologies. Unique optical filter embedding technology helps establish different spectral wavelength response ranges for reference cells, which can reduce spectral mismatch between solar simulators and emerging solar cells. Calibrated reference cells are an indispensable part of solar simulator calibration and accurate solar cell characterization. Enlitech’s calibration laboratory is certified to ISO/IEC 17025 standards. All SRC-2020 series reference cells are calibrated with traceability to NIST. Enlitech also provides reference cell recalibration services.
Enlitech provides various solar reference cells for calibrating the irradiance intensity of solar simulators or daylight simulators. Spectral response curves are shown below. Each reference cell kit includes a WPVS-packaged silicon reference cell with optical window, two Lemo connector cables, and a certified daylight intensity calibration report. Software
IVS-KA6000: The Most Powerful Current-Voltage Measurement Software


All SS-X series solar simulators can be controlled by IVS-KA6000, the most powerful current-voltage (IV) measurement software for precise photovoltaic characterization analysis. Not only optical shutters, but output irradiance can also be controlled by IVS-KA6000 software. This enables users to easily complete complex IV testing under different irradiance levels or solar cell open-circuit voltage (Sun-Voc) testing. All data from IVS-KA6000 can be read and analyzed through IVS-KA-Viewer, another versatile analysis software.
Previously, measuring and fitting the ideality factor n of solar cells was not easy and time-consuming. For example, it typically required one hour to obtain 10 IV curves under 10 different irradiance levels, followed by approximately another hour to organize the data. However, with our testing solution combining SS-X Solar Simulators, IVS-KA6000, and IVS-KA-Viewer, ideality factor N can be measured and fitted within minutes. Please feel free to contact us if you are interested.







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